Vitrek V7X Series Hipot & Ground Bond Testers

Model

Quantity

Description
Features
Specifications
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Vitrek V7X Series – No Other Hipot Tester can Touch ’em

For nearly 25 years, an obsessions has driven us to keep improving how hipot testers perform – speed, accuracy, user safety and reliability have been our driving force. Building a better hipot tester is in our DNA – it drove us to successfully engineer the first 4-in-1 safety tester back in 1990 and it has driven us to redefine performance in low cost hipot testers today.

The Hipot Experience has been Redefined

Our goal for the V7X series has been to achieve the unheard of. To provide state-of-the-art
performance in a powerful yet compact multi-function hipot tester – and do it at an entry level price. From our easy-to-use Touch user interface, to its ultra-reliability, high efficiency, fan free design – the V7X provides unrivaled performance. Have we met our goal? You be the judge – compare the V7X to our made in China competitors and see how well American engineering stands up. We build Vitrek Hipot Testers. What’s on your production line?

V75 with Built-in Hipot Switching

For high voltage cable & component testing – choose the V75 with 16 channels of built-in high voltage switching. With the versatile V75, you can test hipot or IR for any combination of up to 8 test points and you can measure low resistance (from .001 ohm to 60K ohms) on up to 8 conductors. All automatically with a single touch and all from a single compact tester. For requirements exceeding 8 points, the V7X can control up to 4 Vitrek 964i 64 channel HV Switching Systems – providing up to 256 channels of Hipot test capability. Simple, fast, automatic multi-point hipot – make the switch to the Vitrek V7X. You will be glad you did.

Product Features and Benefits

4.3″ Color Touch Display – Easy To Use Intuitive User Interface
6 Functions Choose From – AC/DC Hipot, IR, Ground Bond, Continuity & Built-in Switching
Made in the USA – Designed & Built in San Diego CA
Compact, Lightweight, Rugged, Fan Free, Fast (100mS min test time) & Accurate
5KV AC/DC Hipot, 20mA max source current
Ground Bond 1-30A RMS (42 A peak), 100µΩ Resolution
100 nano-Amp Leakage Current Resolution
Low Cost of Ownership – 2 Year Calibration Interval
USB 2.0, Serial/RS232, Digital I/O Interfaces are Standard
Continuously Variable Insulation Resistance 20-5000V, 450GΩ Max
Multi Mode IR with Steady/Rising Pass Mode
Test Memory Stores up to 999 Steps and 60 Test Sequences
Internal Self Test Fully Exercises Output and Verifies Current Accuracy
Pre-Programmed Daily Verification Test With Optional PVD Test Load
150µS Safety Shutdown
Ramped Discharge Capability
Selectable ARC Detection 1-20mA
Meets UL, CSA, IEC Safety Tester Requirements
CE Safety Mark Certified to EN61010
2 Year Parts & Labor Warranty

Front Panel Features

4.3″ Color Touch Display, All of the info you need – Super Easy to Use
Large, Bright LED Caution Testing Indicator
Safety Locked HV Terminal for Hipot & IR
Low Profile High Current Binding Posts for Ground Bond
Independent LED Pass/Fail Indicators
The Brand You Trust on Your Production Line
Convenient Front Panel Power Switch
Ultra-High Reliability Start/Stop Switches

Rear Panel Features

Digital I/O with Safety Interlock
Controls up to 4 HV Scanners (N/A on V75 with built-in HV Switching)
USB 2.0 High Speed Universal Serial Port
RS232 Serial Port with Selectable baud rate up to 115Kbaud
Ultra-Quiet, Ultra-Reliable, High Efficiency Fan Free Design
Heavy Duty 100% Silicone Protective Bumpers
Advanced Design, Built-in Quality – Made in the USA
Optional Rear Panel Terminals or on V75 16 terminals for Hipot/IR & Continuity
Rugged V7X with Drop Resistant Duty Silicone Bumper

V7X Test Step Specifications

Accuracy specifications shown are valid at temperatures within ±5C of the calibration temperature. Outside of this range add 10% of the specification per C.
Decrease maximum ACW, DCW and IR voltages by 2.5%/1000ft above 5000ft ASL altitude.
All accuracy specifications are valid at the V7X terminals, and as such do not include any effects due to user wiring resistances, leakages or coupling, or other user generated leakages or interference.
Resolutions shown are for displayed measurements, limits and settings. Internally all measurements have typically 10x better resolution and all limits and settings are implemented with the same resolution as entered by the user. Via an interface, all measurements are reported with 5 digit resolution.
Generally, user settings can be defined with up to 4 digit resolution and a selection of units (e.g. µA or mA) from the front panel; or with up to 6 digit resolution from an interface.
Unless otherwise specified, user terminated dwell/test periods can extend for up to 2 days.

Not all test types are available in all models of V7X.

ACW Test Steps

Voltage
10 to 5000Vrms (1V resolution) sinewave at 50 or 60Hz +/- 0.05%
Model V75: 10 to 2000Vrms (1V resolution) sinewave at 50 or 60Hz +/- 0.05%
Model V76: 10 to 2500Vrms (1V resolution) sinewave at 50 or 60Hz +/- 0.05%
1%+5V accuracy under all allowed loading conditions
Max. Load
20mArms (10mArms max resistive for >10sec), reduced by 20µA per V below 1000V, reduced by 10µA per V above 4000V
Leakage Accuracy
DC coupled, true RMS, 10Hz-4KHz 3dB bandwidth
DUT isolated (<1.1mA) : 1%+5µA (1µA resolution) DUT isolated (>1.1mA) : 1%+30µA (10µA resolution)
DUT grounded : 1%+30µA+(4µA per KV) (10µA resolution)
ARC Limit
Disabled or up to 30mA (1mA resolution)
Ramp
0 to 99.9sec (0.02sec resolution)
Dwell
0.1 to 9999sec (0.1sec resolution) or user terminated
Shutdown
Excessive HV terminal current : within 1ms
User Stop : within 2ms
Interlock opened (if enabled) : within 2ms
Load Breakdown (sudden uncontrolled increase of load current): within 150µs
Leakage Limit (if enabled) : within 100ms
ARC Limit (if enabled) : within 1ms
User Settings
Voltage Level
Frequency
DUT Isolated/Grounded
Min. Leakage Limit (can be disabled)
Max. Leakage Limit (can be disabled)
ARC Limit (can be disabled)
Ramp Period
Dwell Period
Ramp Down Fast/As Ramp
Stop/Continue Sequence on Failure

DCW Test Steps

Voltage
20 to 5000VDC (1V resolution)
Model V75: 20 to 3000VDC (1V resolution)
Model V76: 20 to 2750VDC (1V resolution)
1%+5V accuracy under all allowed loading conditions
Max. Load
<2000V : 10mA (reduce by 10uA per Volt below 1000V), <0.25uF capacitance 2000-3000V : 7mA (reduce by 4µA per volt above 2000V), <0.1µF capacitance 3000-4000V : 3mA (reduce by 1µA per volt above 3000V), <0.05µF capacitance >4000V : 2mA (reduce by 0.5µA per volt above 4000V), <0.03µF capacitance Leakage Accuracy
DUT resistive, isolated (<200µA) : 1%+1µA (0.1µA resolution) DUT resistive, isolated (0.2-1.5mA) : 1%+2µA (1µA resolution) Otherwise : 1%+20µA (10µA resolution) ARC Limit
Disabled or up to 30mA (1mA resolution)
Ramp
DUT resistive : 0.1 to 99.9sec (0.02sec resolution)
DUT capacitive : 1.0 to 99.9sec (0.02sec resolution)
Dwell
0.1 to 9999sec (0.02sec resolution) or user terminated
Ramp Down
0sec or as defined for ramp
Discharge Internal
50KΩ discharge load and 0.03µF capacitive energy
Shutdown
Excessive HV terminal current : within 1ms
User Stop : within 2ms
Interlock opened (if enabled) : within 2ms
Load Breakdown (sudden uncontrolled increase of load current): within 150µs
Leakage Limit (if enabled) : within 100ms
ARC Limit (if enabled) : within 1ms
User Settings
Voltage Level
DUT Isolated/Grounded
DUT Resistive/Capacitive
Min. Leakage Limit (can be disabled)
Max. Leakage Limit (can be disabled)
ARC Limit (can be disabled)
Ramp Period
Dwell Period
Ramp Down Fast/As Ramp
Stop/Continue Sequence on Failure

IR Test Steps

Voltage
20 to 5000VDC (1V resolution)
Model V75: 20 to 3000VDC (1V resolution)
Model V76: 20 to 2750VDC (1V resolution)
2.5%+5V accuracy under all allowed loading conditions
Lowest IR
<1000V : 150kΩ 1000-2000V : 400kΩ 2000-3000V : 2MΩ >3000V : 10MΩ
Highest IR
DUT resistive, isolated : 90MΩ per V
DUT capacitive, isolated : 2MΩ per V
DUT grounded : 0.1MΩ per V
Max Capacitance
<1000V : 2uF 1000-2000V : 0.25uF 2000-3000V : 0.1uF >3000V : 0.03uF
5mA maximum charging current
IR Accuracy
<5% of Highest IR: 2% (0.1% resolution) 5-15% of Highest IR: 5% (1% resolution) 15-30% of Highest IR: 10% (1% resolution) >30% of Highest IR: 20% (1% resolution)
Test Time
0.1 to 9999sec (0.1sec resolution) or user terminated
Test Delay
0.0 to 9999sec (0.1sec resolution)
Discharge
Internal 50KΩ discharge load and 0.03µF capacitive energy
Shutdown
Excessive HV terminal current : within 1ms
User Stop : within 2ms
Interlock opened (if enabled) : within 2ms
Load Breakdown (sudden uncontrolled increase of load current): within 150µs
IR Limit (if enabled) : within 100ms
ARC Limit (if enabled) : within 1ms
User Settings
Voltage Level
DUT Isolated/Grounded
DUT Resistive/Capacitive
Min. IR Limit
Max. IR Limit (can be disabled)
Ramp Period
Dwell Period
Delay Period
Dwell End On Pass/Fail/Time/Steady or Rising
Ramp Down Fast/As Ramp
Stop/Continue Sequence on Failure

CONT Test Steps

Method
2 terminal measurement (DC)
Test Current
<10.5mA Test Voltage
<4.15V Range
0Ω to 60KΩ
Accuracy
<0.75Ω : 1.5% + 0.015Ω (0.001Ω resolution) <13Ω : 1.5%+0.02Ω (0.01Ω resolution) 13-1000Ω : 3%+1Ω (1Ω resolution) 1K-4KΩ : 4% (10Ω resolution) 4K-13KΩ : 5% (100Ω resolution) >13KΩ : 10% (1KΩ resolution)
Test Time
0.06 to 9999sec (0.02sec resolution) or user terminated
CONT Leakage
DCW or IR test steps : <0.1µA ACW test steps : <2.5µA per KV setting (DUT isolated), <5µA (DUT grounded) User Settings
Min. Limit (can be disabled)
Max. Limit (can be disabled)
Resistance Offset
Test Time
Stop/Continue Sequence on Failure

GB Test Steps

Method
4 terminal measurement (AC)
Current
1 to 30Arms (0.01A resolution) sinewave at 50 or 60Hz +/- 0.05%
3%+10mA accuracy
Compliance
>4.5Vrms at all currents
Open Circuit
<10Vpk DUT Ground
DUT may be isolated from ground or be grounded. If grounded, must be within 3Vpk of V7X ground.
Range
Max resistance determined by max compliance and test current
Accuracy
<2A : 3.5%+3mΩ (1mΩ resolution) 2-6.5A : 3%+2mΩ (1mΩ resolution) >6.5A : 2.5%+1mΩ (0.1mΩ resolution)
Test Time
≤20A : 0.1 to 9999sec (0.02sec resolution) or user terminated
>20-25A : 0.1 to 180sec (0.02sec resolution) or user terminated
>25A : 0.1 to 120sec (0.02sec resolution) or user terminated (50% max duty cycle)
GB Leakage
DCW or IR test steps : <1µA ACW test steps : <5µA per KV setting (DUT isolated), <10µA (DUT grounded) User Settings
Current Level
Frequency
Min. Limit (can be disabled)
Max. Limit
Resistance Offset
Test Time
Stop/Continue Sequence on Failure

PAUSE Test Steps

Pause Delay
0.1 to 9999sec (0.02sec resolution)
User Settings
Pause Delay

HOLD Test Steps

Timeout
0.1 to 9999sec (0.02sec resolution) or none
User Settings
Timeout (can be disabled)
Message (two lines)

SWITCH Test Steps

Execution Time
User Settings
Sub Type (Model V75)
Relay states for each relay in the specified Sub Type (Model V75)
Relay states for each relay in each switch unit (4 max switch units) (All other models)

Dimensional Specifications

137mmH x 248mmW x 284mmD (5.4″ x 9.75″ x 11.2″)
V70, 71, 73, 75, and 79: 6.8kg (15lb) net, 7.9kg (17.5lb) shipping
V74: 7.9kg (17.5lb) net, 9.1kg (20lb) shipping
Dimensions and weights shown are nominal

Environmental Specifications

Storage Environment: -20 to 75C (non-condensing)
Operating Environment: 0 to 40C, <85% RH (non-condensing), Pollution Degree 2 Operating Altitude: 0 to 10000ft ASL, reduced maximum voltage capability above 5000ft

Power Source Specifications

Internally set for 105-125Vrms or 210-250Vrms, 45-65Hz, 200VA maximum