V7X Test Step Specifications
Accuracy specifications shown are valid at temperatures within ±5C of the calibration temperature. Outside of this range add 10% of the specification per C.
Decrease maximum ACW, DCW and IR voltages by 2.5%/1000ft above 5000ft ASL altitude.
All accuracy specifications are valid at the V7X terminals, and as such do not include any effects due to user wiring resistances, leakages or coupling, or other user generated leakages or interference.
Resolutions shown are for displayed measurements, limits and settings. Internally all measurements have typically 10x better resolution and all limits and settings are implemented with the same resolution as entered by the user. Via an interface, all measurements are reported with 5 digit resolution.
Generally, user settings can be defined with up to 4 digit resolution and a selection of units (e.g. µA or mA) from the front panel; or with up to 6 digit resolution from an interface.
Unless otherwise specified, user terminated dwell/test periods can extend for up to 2 days.
Not all test types are available in all models of V7X.
ACW Test Steps
Voltage
10 to 5000Vrms (1V resolution) sinewave at 50 or 60Hz +/- 0.05%
Model V75: 10 to 2000Vrms (1V resolution) sinewave at 50 or 60Hz +/- 0.05%
Model V76: 10 to 2500Vrms (1V resolution) sinewave at 50 or 60Hz +/- 0.05%
1%+5V accuracy under all allowed loading conditions
Max. Load
20mArms (10mArms max resistive for >10sec), reduced by 20µA per V below 1000V, reduced by 10µA per V above 4000V
Leakage Accuracy
DC coupled, true RMS, 10Hz-4KHz 3dB bandwidth
DUT isolated (<1.1mA) : 1%+5µA (1µA resolution) DUT isolated (>1.1mA) : 1%+30µA (10µA resolution)
DUT grounded : 1%+30µA+(4µA per KV) (10µA resolution)
ARC Limit
Disabled or up to 30mA (1mA resolution)
Ramp
0 to 99.9sec (0.02sec resolution)
Dwell
0.1 to 9999sec (0.1sec resolution) or user terminated
Shutdown
Excessive HV terminal current : within 1ms
User Stop : within 2ms
Interlock opened (if enabled) : within 2ms
Load Breakdown (sudden uncontrolled increase of load current): within 150µs
Leakage Limit (if enabled) : within 100ms
ARC Limit (if enabled) : within 1ms
User Settings
Voltage Level
Frequency
DUT Isolated/Grounded
Min. Leakage Limit (can be disabled)
Max. Leakage Limit (can be disabled)
ARC Limit (can be disabled)
Ramp Period
Dwell Period
Ramp Down Fast/As Ramp
Stop/Continue Sequence on Failure
DCW Test Steps
Voltage
20 to 5000VDC (1V resolution)
Model V75: 20 to 3000VDC (1V resolution)
Model V76: 20 to 2750VDC (1V resolution)
1%+5V accuracy under all allowed loading conditions
Max. Load
<2000V : 10mA (reduce by 10uA per Volt below 1000V), <0.25uF capacitance 2000-3000V : 7mA (reduce by 4µA per volt above 2000V), <0.1µF capacitance 3000-4000V : 3mA (reduce by 1µA per volt above 3000V), <0.05µF capacitance >4000V : 2mA (reduce by 0.5µA per volt above 4000V), <0.03µF capacitance Leakage Accuracy
DUT resistive, isolated (<200µA) : 1%+1µA (0.1µA resolution) DUT resistive, isolated (0.2-1.5mA) : 1%+2µA (1µA resolution) Otherwise : 1%+20µA (10µA resolution) ARC Limit
Disabled or up to 30mA (1mA resolution)
Ramp
DUT resistive : 0.1 to 99.9sec (0.02sec resolution)
DUT capacitive : 1.0 to 99.9sec (0.02sec resolution)
Dwell
0.1 to 9999sec (0.02sec resolution) or user terminated
Ramp Down
0sec or as defined for ramp
Discharge Internal
50KΩ discharge load and 0.03µF capacitive energy
Shutdown
Excessive HV terminal current : within 1ms
User Stop : within 2ms
Interlock opened (if enabled) : within 2ms
Load Breakdown (sudden uncontrolled increase of load current): within 150µs
Leakage Limit (if enabled) : within 100ms
ARC Limit (if enabled) : within 1ms
User Settings
Voltage Level
DUT Isolated/Grounded
DUT Resistive/Capacitive
Min. Leakage Limit (can be disabled)
Max. Leakage Limit (can be disabled)
ARC Limit (can be disabled)
Ramp Period
Dwell Period
Ramp Down Fast/As Ramp
Stop/Continue Sequence on Failure
IR Test Steps
Voltage
20 to 5000VDC (1V resolution)
Model V75: 20 to 3000VDC (1V resolution)
Model V76: 20 to 2750VDC (1V resolution)
2.5%+5V accuracy under all allowed loading conditions
Lowest IR
<1000V : 150kΩ 1000-2000V : 400kΩ 2000-3000V : 2MΩ >3000V : 10MΩ
Highest IR
DUT resistive, isolated : 90MΩ per V
DUT capacitive, isolated : 2MΩ per V
DUT grounded : 0.1MΩ per V
Max Capacitance
<1000V : 2uF 1000-2000V : 0.25uF 2000-3000V : 0.1uF >3000V : 0.03uF
5mA maximum charging current
IR Accuracy
<5% of Highest IR: 2% (0.1% resolution) 5-15% of Highest IR: 5% (1% resolution) 15-30% of Highest IR: 10% (1% resolution) >30% of Highest IR: 20% (1% resolution)
Test Time
0.1 to 9999sec (0.1sec resolution) or user terminated
Test Delay
0.0 to 9999sec (0.1sec resolution)
Discharge
Internal 50KΩ discharge load and 0.03µF capacitive energy
Shutdown
Excessive HV terminal current : within 1ms
User Stop : within 2ms
Interlock opened (if enabled) : within 2ms
Load Breakdown (sudden uncontrolled increase of load current): within 150µs
IR Limit (if enabled) : within 100ms
ARC Limit (if enabled) : within 1ms
User Settings
Voltage Level
DUT Isolated/Grounded
DUT Resistive/Capacitive
Min. IR Limit
Max. IR Limit (can be disabled)
Ramp Period
Dwell Period
Delay Period
Dwell End On Pass/Fail/Time/Steady or Rising
Ramp Down Fast/As Ramp
Stop/Continue Sequence on Failure
CONT Test Steps
Method
2 terminal measurement (DC)
Test Current
<10.5mA Test Voltage
<4.15V Range
0Ω to 60KΩ
Accuracy
<0.75Ω : 1.5% + 0.015Ω (0.001Ω resolution) <13Ω : 1.5%+0.02Ω (0.01Ω resolution) 13-1000Ω : 3%+1Ω (1Ω resolution) 1K-4KΩ : 4% (10Ω resolution) 4K-13KΩ : 5% (100Ω resolution) >13KΩ : 10% (1KΩ resolution)
Test Time
0.06 to 9999sec (0.02sec resolution) or user terminated
CONT Leakage
DCW or IR test steps : <0.1µA ACW test steps : <2.5µA per KV setting (DUT isolated), <5µA (DUT grounded) User Settings
Min. Limit (can be disabled)
Max. Limit (can be disabled)
Resistance Offset
Test Time
Stop/Continue Sequence on Failure
GB Test Steps
Method
4 terminal measurement (AC)
Current
1 to 30Arms (0.01A resolution) sinewave at 50 or 60Hz +/- 0.05%
3%+10mA accuracy
Compliance
>4.5Vrms at all currents
Open Circuit
<10Vpk DUT Ground
DUT may be isolated from ground or be grounded. If grounded, must be within 3Vpk of V7X ground.
Range
Max resistance determined by max compliance and test current
Accuracy
<2A : 3.5%+3mΩ (1mΩ resolution) 2-6.5A : 3%+2mΩ (1mΩ resolution) >6.5A : 2.5%+1mΩ (0.1mΩ resolution)
Test Time
≤20A : 0.1 to 9999sec (0.02sec resolution) or user terminated
>20-25A : 0.1 to 180sec (0.02sec resolution) or user terminated
>25A : 0.1 to 120sec (0.02sec resolution) or user terminated (50% max duty cycle)
GB Leakage
DCW or IR test steps : <1µA ACW test steps : <5µA per KV setting (DUT isolated), <10µA (DUT grounded) User Settings
Current Level
Frequency
Min. Limit (can be disabled)
Max. Limit
Resistance Offset
Test Time
Stop/Continue Sequence on Failure
PAUSE Test Steps
Pause Delay
0.1 to 9999sec (0.02sec resolution)
User Settings
Pause Delay
HOLD Test Steps
Timeout
0.1 to 9999sec (0.02sec resolution) or none
User Settings
Timeout (can be disabled)
Message (two lines)
SWITCH Test Steps
Execution Time
User Settings
Sub Type (Model V75)
Relay states for each relay in the specified Sub Type (Model V75)
Relay states for each relay in each switch unit (4 max switch units) (All other models)
Dimensional Specifications
137mmH x 248mmW x 284mmD (5.4″ x 9.75″ x 11.2″)
V70, 71, 73, 75, and 79: 6.8kg (15lb) net, 7.9kg (17.5lb) shipping
V74: 7.9kg (17.5lb) net, 9.1kg (20lb) shipping
Dimensions and weights shown are nominal
Environmental Specifications
Storage Environment: -20 to 75C (non-condensing)
Operating Environment: 0 to 40C, <85% RH (non-condensing), Pollution Degree 2 Operating Altitude: 0 to 10000ft ASL, reduced maximum voltage capability above 5000ft
Power Source Specifications
Internally set for 105-125Vrms or 210-250Vrms, 45-65Hz, 200VA maximum