Components and other electronic and electrical products may experience repeating impact during transportation or use. Bump test can be used as a method to ensure the satisfaction of design structure or as a quality assurance method. Specimen will experience regular peak acceleration and continuous impact with standard pulse during the bump test.
Specifications
![](https://cdn.shopify.com/s/files/1/0327/6364/1996/t/36/assets/spec2-1676182179835.png?v=1676182184)
![](https://cdn.shopify.com/s/files/1/0327/6364/1996/t/36/assets/spec1-1676182179826.png?v=1676182181)
![](https://cdn.shopify.com/s/files/1/0327/6364/1996/t/36/assets/spec3-1676182179865.png?v=1676182187)