SPS5000 semiconductor parametric test software is equipped with the IT2800 high precision source measurement unit. It helps to quickly complete semiconductor test of device IV characterization and parametric test.SPS5000 supports DC, pulse, single and bidirectional sweeping modes. With an intuitive GUI, the SPS5000 helps university laboratories, semiconductor suppliers and research institutes to quickly perform semiconductor device characterization test. No programming knowledge is required when you use it.

SPS5000 software provides ready-to-use test items for different types of semiconductor devices such as MOSFETs, BJTS, diodes, and resistors. Take Diodes as an example, its ready-to-use test items include breakthrough voltage, forward bias, reverse bias and I-V. Depending on the test requirements, users can execute only one test item at a time, or a test sequence with multiple test items for rapid parametric analysis(- capable for items with the same wiring). The graphical display window and various powerful features of SPS5000 allow user to perform the measurement quickly and acquire the result graphically, dramatically improving the test efficiency of characterization.

Ready-to-use test items greatly accelerate the semiconductor devices characterization

The SPS5000 software provides convenient ready-to-use test items for different types of semiconductor devices such as MOSFETs, BJTS, diodes, and resistors. Enabling user to perform measurement setup and data collecting quickly without any secondary programming. Take MOSFET test as an example, a common testing process will be like this: defining test variables---develop the testing methods-----writing automated test code-----executing the test-----making the data analysis. By using SPS5000, user can simply the test process in three steps with the preinstalled test items. Step one is to select the ready-to-use test item such as Id-Vd. Step two is to configure the measurement conditions. The last step is the clicking “running” to start the test. When test is finished, user can acquire the data and graphs automatically

Automated test sequence mode to fulfill multiple characterization test

The SPS5000 software provides a flexible and high-efficiency testing mode by allowing the user to form a test sequence with multiple ready-to-use test items. Automated test sequence mode is important to efficiently gather multiple parameters on the semiconductor device. For example, when you select Id-Vd test item of MOSFET, SPS5000 will automatically recall other test items with the same wiring connection, such as Vth, FET Id-Vg. users can execute only one test item at a time (e.g. Id-Vd), or combine them into a sequence for rapid multiple parametric test(Id-Vd ->Vth -> IonIoffslop ->…).

The GUI based characterization software SPS5000 allow user to perform the measurement setup quickly and get the result graphically. It not only directly display the calculated and extracted parameters, but also provide powerful graph analysis tools for further analysis, such as auto-scaling and line operations( constant line, tangent line and regression line). User can also use the strip feature to mark MOSET cut-off or saturation regions on the graph. In addition, SPS5000 supports multiple Y axes capabilities. User can flexibly configure the data types of the X-axis and Y-axis, log or linear scale format according to the analysis requirements